发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT ADAPTED TO CARRY OUT A TEST OPERATION
摘要 <p>A semiconductor integrated circuit device includes a memory cell array, a decoder circuit, a selection circuit and a plurality of input/output terminals. The selection circuit is connected to one of the terminals and includes a high voltage detector circuit for producing a control signal only when a predetermined voltage higher than a power source voltage is applied to one of the terminals. The selection circuit further includes a latch circuit connected to the terminals other than the one terminal, for latching an input signal in response to a control signal produced from the high voltage detector circuit. When a predetermined high voltage is applied to the high voltage detector circuit through one of the terminals, the signal input from the other terminals is latched, in response to the control signal. The status of the memory cell array and the decoder circuit is made to a predetermined specific mode, based upon the latched signal.</p>
申请公布号 EP0212997(B1) 申请公布日期 1991.09.25
申请号 EP19860401359 申请日期 1986.06.20
申请人 FUJITSU LIMITED 发明人 YOSHIDA, MASANOBU
分类号 G06F11/22;G01R31/28;G01R31/3185;G11C11/401;G11C29/00;G11C29/14;G11C29/46;H01L21/66;H01L21/822;H01L27/04 主分类号 G06F11/22
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