发明名称 PHOTOMASK
摘要 <p>PURPOSE:To shorten the time required to produce a photomask and to reduce the cost of the photomask by coating an optically transparent substrate with a compd. causing fading reaction and color development reaction under light in a region from UV to IR so that a pattern can directly be written and vanished. CONSTITUTION:A pattern recording layer 1 is formed on a quartz sheet as a substrate 2 by spin coating with a spiropyrane compd. dispersed in polystyrene or direct vapor deposition of the spiropyrane compd. A drawn pattern 3 is written in the pattern recording layer 1 by a direct drawing method with He-Cd laser light. When the entire surface of the resulting photomask is irradiated with IR rays, the pattern 3 is vanished and the layer 1 is made transparent again. A pattern is written again in the layer 1 with He-Cd laser light. The time required to produce the photomask is shortened and the cost of the photomask is reduced.</p>
申请公布号 JPH03214160(A) 申请公布日期 1991.09.19
申请号 JP19900009703 申请日期 1990.01.19
申请人 NEC CORP 发明人 KOMATSU ATSUSHI
分类号 G03F1/50;G03F1/54;G03F1/72;H01L21/027 主分类号 G03F1/50
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