发明名称 Method of manufacturing semiconductor device.
摘要 Disclosed is a method of manufacturing a semiconductor device, which comprises the steps of forming a solid phase diffusion source (3) containing a conductive impurity on a surface of a semiconductor substrate (1), said impurity serving to enable said semiconductor substrate (1) to exhibit a p-type or n-type conductivity, allowing said solid phase diffusion source (3) to contain a diffusion control substance serving to reduce or oxidize said conductive impurity upon heating so as to change the diffusion coefficient of the conductive impurity contained in the solid phase diffusion source (3), and thermally diffusing the conductive impurity from the solid phase diffusion source (3) into the semiconductor substrate (1). <IMAGE> <IMAGE>
申请公布号 EP0446532(A2) 申请公布日期 1991.09.18
申请号 EP19900314429 申请日期 1990.12.28
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TSUNASHIMA, YOSHITAKA, C/O INTELL. PROPERTY DIV.
分类号 H01L21/22;H01L21/225;H01L21/318;H01L21/334;H01L21/336;H01L29/78 主分类号 H01L21/22
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