PRUEFKOPF FUER KONTAKTFLAECHEN VON WERTKARTEN MIT EINGELAGERTEM HALBLEITERCHIP

摘要

A probe for determining the position of the contact areas, particularly of a value card with embedded semiconductor chip, for its correspondence with a tolerance window defined by a standard, particularly the international standard ISO 7816/2, exhibits a plate of electrically insulating material. In the plate, electrically conductive contact pins are arranged in such a manner that their points touch at least the centre and one edge or corner of at least one contact surface according to the standard. The probe is useful, in particular, for positioning a standard card for the accurately dimensioned further processing, particularly the stamping out of a minichip card (plug-in SIM) from a standard card.