ELECTRIC DEVICE OR CIRCUIT TESTING METHOD AND APPARATUS

摘要

A method and apparatus for testing an electrical device and/or circuit in which the device or circuit is stimulated with a known input signal and in which three or more measurements of the response of the device or circuit to such stimulus are taken and utilized to predict a final value of such response according to a predetermined relationship between such predicted final response and the measured response values. Typically the present invention can predict such final value without waiting for the actual final value of the response to occur.