| 摘要 |
PURPOSE:To identify a substance speedily and positively by performing the measure ment of X-ray diffraction and analysis of elements by the same apparatus through rotation of a sample holder. CONSTITUTION:When an X-ray is radiated to a sample 1 from an X-ray source 4 with an angle of incidence theta to scan the sample 1 continuously with the theta while a detector 5 is arranged to keep the position of 2theta, a diffraction peak is obtained when a value to satisfy the diffraction conditions of Bragg is present within a distance between parallel faces to the surface of the sample. Since the spectrum of the X ray projected from the X-ray source 4 includes a continuous X ray spreading over a wide range of wavelengths and a characteristic X ray showing a particularly strong peak, it is possible to identify composing elements of an unknown substance by detecting and analyzing the continuous X ray and characteristic X ray by an X-ray spectroscope 8 and an X-ray detector 6. Thereafter, the measured diffraction pattern is input to a computer 7, whereby a simplified pattern is obtained according to a peak detecting program. The information of the elements form the spectroscope 8 is also input to the computer 7 through the detector 6. Accordingly, only a substance the composing elements of which are agreed is extracted and displayed among those standard substances of similar diffraction patterns by retrieval of the data base with the use of these two information. |
