| 摘要 |
<p>A probe for a coordinate measuring machine or machine tool has a housing (10) from which extends a workpiece-contacting stylus (14). When the stylus (14) contacts a workpiece, as the probe is driven towards the workpiece, overtravel is permitted by deflection of a stylus holding member (12) within an overtravel module (18), out of a kinematic mount (20, 22). The contact with the workpiece is detected by sensors provided on a plate, board or wafer (26). In the event of excessive overtravel, in order to protect the fragile plate (26), a flange (36) on the stylus (14) contacts the housing (at 10A), and a kinematic mount (28, 30) disengages to permit the overtravel module (18) to fall away from the plate (26). Thus, any excess loading is taken between the flange (36) and the housing (at 10A), and is not transmitted through the plate (26).</p> |
