DIAGNOSTIC SYSTEM FOR TEXTILE DYEING APPARATUS

摘要

A diagnostic system checks the major hardware components in a pattern control system used in a textile dyeing apparatus. The system includes bypass logic circuitry which permits selective bypassing of either the look-up tables, stagger memories, or both the look-up tables and the stagger memories in the pattern control system. The diagnostic system checks the look-up tables in the pattern control system to assure that the address lines for the look-up tables operate properly. A prime number pattern is loaded into the look-up tables such that each address location for each look-up table will have a different piece of data. The look-up tables are then read in address sequence and the output thereof compared with a previously stored prime number pattern to determine whether any errors arose. The system further checks the firing times produced by the gatling memory section of the pattern control system by simulating a machine speedup and checking for the onset of machine optimum speed and machine overspeed.