Evaluating strip patterns for optical measuring process - modulating by carrier frequency and imaging on sensor for evaluating by phase shift algorithm

摘要

The strip pattern contg. measuring information relating to the object is modulated by a carrier frequency pattern by appropriate adjustment of the optical measuring construction. A strip pattern, also contg. the measuring information, is approximately periodically derived from the surface of the imaging sensor. This strip pattern is evaluated according to a phase shift algorithm matched to the periodicity of the carrier frequency. An interference pattern can be produced in an interferometer (1) through coherent modulation of the waves (2) from the object and reference waves (3). The result can be imaged by a CCD camera (4). ADVANTAGE - Does not require phase shift equipment and can cope with dynamic processes.