| 摘要 |
<p>A magnetic field distribution measuring apparatus for measuring an external magnetic field distribution includes a substrate (1) made of a nonmagnetic material and having opposite surfaces, a plurality of magnetoresistive elements (15) deposited on one surface of the substrate (1) and each made of a superconductive material having a weak coupling at the grain boundaries. Coils (5a, 5b, 20a, 20b) are provided on the other surface of the substrate (1) at positions corresponding to the magnetoresistive elements (15). The coils are sequentially applied with AC current to produce AC magnetic field having a peak value greater than a magnetic field threshold level at which the magnetoresistive element (15) changes the state from a superconductive state to a magnetoresistive state. Detecting the degree of magnetoresistive from each magnetoresistive element (15), the magnetic field distribution can be detected. <IMAGE></p> |
