发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF |
摘要 |
PURPOSE:To make a semiconductor device stable in distribution of a surface electrical field so as to improve it in reliability to breakdown strength and to widen the thickness and the impurity concentration of a first semiconductor region in allowable range so as to improve the semiconductor device in degree of freedom of design. CONSTITUTION:An N<-> epitaxial layer 32 is formed on a P<-> semiconductor substrate 31, and a P diffusion region 33 is formed in the epitaxial layer 32 so as to reach to the P<-> semiconductor substrate 31 extending from the surface of the layer 32. An N<+> diffusion region 34 and a P diffusion region 35 are formed on the surface of the N<-> epitaxial layer 32. A conductive film 37 is formed on the surface of the N<-> epitaxial layer 32 between the P diffusion regions 33 and 35 through the intermediary of a comparatively thin insulating film 36. The conductive film 37 and the P diffusion region 35 are made to function as a composite field plate, a depletion layer is made to extend laterally further on the surface of the N<-> epitaxial layer 32 through the influence of the electrical field generated from the composite field plate concerned, whereby a surface electrical field is relaxed and a diode is improved in breakdown strength. |
申请公布号 |
JPH03201452(A) |
申请公布日期 |
1991.09.03 |
申请号 |
JP19890340202 |
申请日期 |
1989.12.28 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
ODA TAKESHI;SATSUMA KAZUMASA;GOORABU MAJIYUMUDAARU;TERAJIMA TOMOHIDE;YAMAGUCHI HIROSHI;FUKUNAGA MASANORI;YOSHIZAWA MASAO |
分类号 |
H01L29/73;H01L21/331;H01L21/336;H01L21/66;H01L29/06;H01L29/40;H01L29/732;H01L29/735;H01L29/739;H01L29/745;H01L29/78;H01L29/861 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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