发明名称 Method for manufacturing a DRAM using selective epitaxial growth on a contact
摘要 A method for manufacturing a semiconductor device includes forming contact holes in insulating layers to expose an impurity doped region of a semiconductor substrate. An epitaxial layer is then grown in the contact hole. A polycrystalline silicon layer is formed over the top to provide the lower electrode of a capacitor. Accordingly, the polycrystalline layer is separated from the impurity doped region thereby preventing current leakage.
申请公布号 US5045494(A) 申请公布日期 1991.09.03
申请号 US19900494185 申请日期 1990.03.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, DO-CHAN;KIM, KYUNG-TAE
分类号 H01L27/04;H01L21/02;H01L21/285;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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