APPARATUS AND METHODS FOR MEASURING PERMITTIVITY IN MATERIALS

摘要

Devices and analytical techniques are disclosed for measuring the spatial profile of permittivity of a material by multiple wavenumber interrogations. Electrode structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals (of temporary frequency ".omega.") from the electrode structures are attenuated to varying degrees by the material undergoing analysis, depending upon the wavenumber ("k"), thereby permitting the derivation of a composite dielectric profile.