发明名称 |
Multiple detector system for specimen inspection using high energy backscatter electrons. |
摘要 |
<p>An inspection system employing high collection efficiency energy filtered backscatter electrons. At least two detectors (26, 28, 30) are positioned relative to the sample (128) at spaced locations. Each detector has a canister (122) with a fiberoptic bundle (44) mounted therein. A scintillator detector (60) is mounted at the end of the fiberoptic bundle. A ground grid (124) is mounted at an opening of the canister in axial alignment with the scintillator detector. An energy filter (56) is interposed between the scintillator detector and the ground grid. The energy filter is an electrostatic retarding potential grid to permit detection of only high energy backscatter electrons. The geometry of the detectors relative to the specimen together with the conical shape of the detector housing achieves maximum collection efficiency of the targeted electrons. <IMAGE></p> |
申请公布号 |
EP0443410(A2) |
申请公布日期 |
1991.08.28 |
申请号 |
EP19910101923 |
申请日期 |
1991.02.12 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HILDENBRAND, WALTER WILLIAM;UTTERBACK, STEVEN GREGG |
分类号 |
H01J37/244;H01J37/28;H01L21/66 |
主分类号 |
H01J37/244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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