Method and system for inspecting microprocessor-based unit and/or component thereof

摘要

An inspection device is provided an inspection parameter generator generating predetermined parameter data. The parameter data is transmitted to a control unit subjecting inspection. The inspection device receives input signal from the control unit, which input signal corresponds to the parameter data input to the control unit. Both of the control unit and inspection device processes the corresponding data. The control unit feeds resultant output to the inspection device. The inspection device compares its own resultant data and the resultant output of the control unit to make judgment whether the control unit operates in normal condition or not.