首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Process for forming electrodes for semiconductor devices by focused ion beam technology
摘要
申请公布号
US5043290(A)
申请公布日期
1991.08.27
申请号
US19890338274
申请日期
1989.04.14
申请人
MITSUBISHI DENKI KABUSHIKI KAISHA
发明人
NISHIOKA, TADASHI;MASHIKO, YOJI;MORIMOTO, HIROAKI;KOYAMA, HIROSHI
分类号
H01L21/768
主分类号
H01L21/768
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Golf training aid
An apparatus and a method of shaping an edge of an aerofoil
Message delivery handling
Exhaust after treatment device mode regulation
Apparatus and method for communication
Dose indicator device
PROTECTIVE COATING FOR METAL SURFACES
Jet deflection device
SEMICONDUCTOR PHOTO-ELEMENT AND EXTERNAL RESONANCE LASER HAVING THE SEMICONDUCTOR PHOTO-ELEMENT
Communication units and methods for resource change notification in broadcast communication
PERFUSION BIOREACTORS FOR CULTURING CELLS
PURIFICATION OF BARIUM ION SOURCE
CHAIR
Battery monitoring system
Integrated circuit switching power supply controller with selectable buck mode operation
An active, oxygen scavenging, caps and closures packaging inclusion system, designed to operate in the presence of free water
Thermal compensation of pressure measurements
Compression storage of projection data in a computed tomography system
Improvements to security arrangement, methods and computer software
BIF from WB dynamic