发明名称 Method of forming an IC chip with self-aligned thin film resistors
摘要 Process of making an IC chip with thin film resistors, and IC chips made by such process, wherein a chip substrate first is covered with layers of thin film and interconnect material (with an intermediate barrier layer if needed), such layers being etched away in predetermined regions in accordance with the metal interconnect pattern, the remaining layered material being aligned vertically, and thereafter, in a section of the remaining material, etching away the interconnect material (and barrier material if used) to expose the thin film material to form a thin film resistor which is self-aligned withe the adjoining sections of interconnect conductors. The material in the predetermined regions may be etched by a dry-etch (plasma) or by a wet-etch.
申请公布号 US5043295(A) 申请公布日期 1991.08.27
申请号 US19890368825 申请日期 1989.06.20
申请人 RUGGERIO, PAUL A.;ANDERSON, CYNTHIA E. 发明人 RUGGERIO, PAUL A.;ANDERSON, CYNTHIA E.
分类号 H01L27/04;H01L21/02;H01L21/822;H01L23/532 主分类号 H01L27/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利