发明名称 TREATING METHOD FOR WAFER
摘要 PURPOSE:To enable the facilitation of an annealing of a wafer by laser annealing the wafer before treating the wafer, thereby eliminating the defect in the existing treated part and the decrease in the characteristics of the wafer. CONSTITUTION:To form a mirror-polished wafer before its treatment or a buried diffused layer, a wafer having a region diffused partly with an impurity in a main surface of the wafer is annealed. After the wafer is laser annealed, it is epitaxially treated. In this manner, the wafer can be readily annealed without decrease in the characteristics of the wafer.
申请公布号 JPS5793531(A) 申请公布日期 1982.06.10
申请号 JP19800169556 申请日期 1980.12.03
申请人 HITACHI SEISAKUSHO KK 发明人 KANAI AKIRA;TOCHIKUBO HIROO
分类号 H01L21/205;H01L21/268 主分类号 H01L21/205
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