发明名称 Method and apparatus for inspecting quality of manufactured articles.
摘要 <p>There is disclosed a method for inspecting a physical feature on a surface of a manufactured article. First, a sensor (12) is provided adjacent to the article (1). Then, the surface (1a) of the article (1) is sensed by the sensor (12) while causing one of the sensor (12) and the article (1) to rotate about an axis perpendicular to the surfache (1a) of the article (1), to thereby obtain a signal which has peaks corresponding to the physical feature on the surface (1a) of the article. Subsequently the signal is processed and the processed signal is analyzed based on the number of the peaks, to thereby obtain information as to the physical feature on the surface (1a) of the article (1). An inspection apparatus suitable for practicing the above-mentioned method is also disclosed. &lt;IMAGE&gt;</p>
申请公布号 EP0442005(A1) 申请公布日期 1991.08.21
申请号 EP19900102874 申请日期 1990.02.14
申请人 MITSUBISHI MATERIALS CORPORATION 发明人 ITOH, HAJIME, C/O SHOOHIN KAIHATSU CENTER;ITOW, ATSUO, C/O SHOOHIN KAIHATSU CENTER;INOUE, YOSHIHIRO, C/O SHOOHIN KAIHATSU CENTER;ISHIZAKI, HIROSHI, C/O FUJI OYAMA KOUJOU
分类号 B07C5/34 主分类号 B07C5/34
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