SAMPLE ANALYSIS BY X-RAY DIFFRACTION,申请号JP19890326694-传众专利搜索

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发明名称	SAMPLE ANALYSIS BY X-RAY DIFFRACTION
摘要
申请公布号	JPH03186744(A)	申请公布日期	1991.08.14
申请号	JP19890326694	申请日期	1989.12.16
申请人	SHIMADZU CORP	发明人	SHINDO TAKUYA
分类号	G01N23/20	主分类号	G01N23/20
代理机构		代理人
主权项
地址

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