发明名称 Nonvolatile semiconductor memory device.
摘要 <p>A nonvolatile semiconductor memory device comprises a plurality of memory cell circuits each including a nonvolatile memory cell (M11) consisting of a floating gate transistor. The floating gate transistor has its source connected to a reference voltage (VS) via a conductive layer (N1) having a resistance, and a plurality of semiconductor elements are connected in series with the current path of the floating gate transistor between a power source voltage (VP) and the drain of the floating gate transistor. The effective resistances of the conductive layers between the sources of the floating gate transistors and the reference voltage (VS) are different from each other and the resistance values of the corresponding semiconductor elements are selected so as to be inversely proportional to the effective resistances between the sources of the floating gate transistors and the reference voltage (VS).</p>
申请公布号 EP0441409(A2) 申请公布日期 1991.08.14
申请号 EP19910102850 申请日期 1988.07.27
申请人 KABUSHIKI KAISHA TOSHIBA;TOSHIBA MICRO-COMPUTER ENGINEERING CORPORATION 发明人 MINAGAWA, HIDENOBU, DAINI-TAIYO-SO;TATSUMI, YUUICHI;IWAHASHI, HIROSHI, C/O PATENT DIVISION;ASANO, MASAMICHI, C/O PATENT DIVISION;NAKAI, HIROTO, C/O PATENT DIVISION;IMAI, MIZUHO
分类号 G11C16/10;G11C16/24;G11C16/30;G11C16/34 主分类号 G11C16/10
代理机构 代理人
主权项
地址