发明名称 PROBING APPARATUS
摘要 <p>PURPOSE:To observe a desired signal by providing function setting an input signal selection circuit and the setting condition at the time of observation in connection with signal selection and selectively changing over a desired signal. CONSTITUTION:When the selection of one channel is required with respect to an observation condition control mechanism 8, a probe 10 is selected with respect to an input signal selection circuit 7 to emit a predetermined signal to a multiplexer 2. The relay corresponding to the multiplexer 2 is closed and, at the same time, data for setting an observation condition is sent to an observation condition setting mechanism 9 from the control mechanism 8. The setting mechanism 9 receives the data from the control mechanism 8 to set a vertical axis range setting part 3, a horizontal axis range setting part 4 and a coupling setting part 5 and a desired signal can be observed on a signal display part 6. By this constitution, an apparatus having function automatically set to a preset range is controlled and the signal observation of a plurality of observation points can be efficiently carried out.</p>
申请公布号 JPH03185363(A) 申请公布日期 1991.08.13
申请号 JP19890326277 申请日期 1989.12.14
申请人 MITSUBISHI ELECTRIC CORP 发明人 SUDO YUKO;OGATA TERUAKI
分类号 G01R15/09;G01R13/20;G01R13/28;G01R15/08;G01R31/28 主分类号 G01R15/09
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