发明名称 METHOD FOR ANALYZING COMPONENT USING X-RAYS
摘要 PURPOSE:To perform analysis within a short time with high accuracy by a method wherein an object to be measured is irradiated with X-rays of a predetermined dose having a white X-ray spectrum and absorption processing is applied to a specific energy region to generate specrum distribution having the dose peak value corresponding to absorption characteristics in each of low and high energy regions. CONSTITUTION:Emitted X-rays 10a are transmitted through a filter apparatus 12 attenuating said emitted X-rays 10a permitting white X-ray spectrum distribution A to pass to attenuate the same to a predetermined level and attenuated up to the absorption characteristic B of the filter apparatus to be converted to transmitted X-rays 12a. Herein, as a filter substance, for example, gadolinium is used to differentiate the obtained spectrum distribution C to obtain the attenuation characteristic corresponding to the absorption characteristic of the different K-shell absorption end energy level possessed by the substance. For example, when the salt amount of the bone of an arm part is measured, the arm part is irradiated with X-rays 12a having the distribution C. Next, the X-rays 14a passed through an object 14 to be examined are detected by an X-ray detector 16 and amplified to be discriminated by high and low energy discriminators 20, 22 and a bone salt amount is displayed on a display device 30.
申请公布号 JPH03185345(A) 申请公布日期 1991.08.13
申请号 JP19890324955 申请日期 1989.12.14
申请人 ALOKA CO LTD 发明人 TABEI TOSHIAKI;TAMURA KAZUYUKI;KIMURA SHIGERO;KAWAMURA KOICHI;NINOMIYA SHIZUO
分类号 G01N23/08;A61B6/00;A61B10/00 主分类号 G01N23/08
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