EXAMINATION OF PHYSICAL PROPERTIES OF THIN FILMS

摘要

- 8 - O.Z. 0050/41393 The physical properties of thin films can be examined with polarized light using a method which comprises directing polarized light at a layer system, exciting plasmon surface polaritons therein and thereby creating Raman-scattered light within the layer or layer system under examination, and imaging said light on a detector using an imaging system.