发明名称 SYSTEMS FOR MATERIAL ANALYSIS BASED ON REFLECTANCE RATIO DETECTION
摘要 <p>Systems and methods for material analysis are disclosed in which a material is illuminated at a plurality of discrete wavelengths. Measurements of the intensity of reflected light at such wavelengths are taken, and an analysis of reflection ratios for various wavelengths is performed. The present invention permits non-invasive blood analysis by illumination through the skin and similar analyses of meats and other food materials by non-destructive illumination. Changes in the reflection ratios can be correlated with specific material properties such as the concentration of analytes (e.g., oxygen content, glucose levels, cholesterol or drugs) in a subject's circulatory system or the condition of the food material (e.g., oxidation, contamination, sugar content, ripeness, fermentation, degree of cooking, or other processing stages).</p>
申请公布号 WO1991011136(A1) 申请公布日期 1991.08.08
申请号 US1991000702 申请日期 1991.02.01
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址