| 摘要 |
PURPOSE:To carrying out a high-accuracy modification-processing of a fine particle by equipping, in combination with a laser for trap, a processing pulse laser in the same incidence direction as that of the laser for trap, setting a fine particle sample to the microscope stage and applying laser with a high accuracy in micron order. CONSTITUTION:In combination with a laser (A1) for trap, a processing pulse laser (A2) is equipped in the same incidence direction as that of the laser for trap. (B) represents an unit for fine-positioning of laser application and (C) shows a picture processing unit. The laser units (A1) and (A2) are capable of suitable selection of the laser sources and the optical systems in accordance with kind and size of the objective fine particle and the purpose of required modification and/or processing. As operations of modification and processing of the trapped fine particle, decomposition, division, local conversion and chemical modification of the fine particle, bonding, fusion and cross-licking by functional groups between the mutual fine particles, etc., are exemplified. |
