发明名称 Negative feedback high current driver for in-circuit tester.
摘要 <p>A negative feedback high current driver for an in-circuit tester comprises a three stage amplifier (32, 34, 36) for supplying a high current overdriving signal to a device under test (14). The high current overdriving signal substantially cancels out any remaining component of an in-circuit generated signal appearing at an input to the device under test. &lt;IMAGE&gt;</p>
申请公布号 EP0439261(A2) 申请公布日期 1991.07.31
申请号 EP19910300213 申请日期 1991.01.11
申请人 HEWLETT-PACKARD COMPANY 发明人 KOYAMA, HIROSHI
分类号 G01R31/28;G01R31/319 主分类号 G01R31/28
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