METHOD OF MONITORING CHARGE STABILITY OF DIELECTRIC-SEMICONDUCTOR STRUCTURES WITH SURFACE-ADJOINING P-N-JUNCTION,申请号SU19853981896-传众专利搜索

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发明名称	METHOD OF MONITORING CHARGE STABILITY OF DIELECTRIC-SEMICONDUCTOR STRUCTURES WITH SURFACE-ADJOINING P-N-JUNCTION
摘要
申请公布号	SU1345823(A1)	申请公布日期	1991.07.30
申请号	SU19853981896	申请日期	1985.11.21
申请人	RYSKIN E.Z.,SU	发明人	RYSKIN E.Z.,SU
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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