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发明名称
TEST CIRCUIT
摘要
申请公布号
JPH03175383(A)
申请公布日期
1991.07.30
申请号
JP19890316052
申请日期
1989.12.04
申请人
NEC IC MICROCOMPUT SYST LTD
发明人
IWASE NOBUKAZU
分类号
G01R31/28;G11C29/00;G11C29/14;H01L21/66;H01L27/00
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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