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发明名称
TESTING METHOD FOR IC TO BE MEASURED
摘要
申请公布号
JPH03172780(A)
申请公布日期
1991.07.26
申请号
JP19890313856
申请日期
1989.11.30
申请人
MITSUBISHI ELECTRIC CORP
发明人
YAMAMOTO TAKASHI
分类号
G01R31/28;G01R31/317
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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