发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the generation of bubbles in a resist due to N2 foaming, and to inhibit the scattering of the resist due to foaming by transferring a mask pattern at fixed pressure. CONSTITUTION:The inside of a chamber 6 can be kept at fixed pressure at high pressure by operating a high pressure gas 8 and a vacuum pump 7. A fixed quantity of wafers 5 are carried into the chamber 6, a system is closed, and constant pressure is applied (or reduced) and pressure is kept constant. The wafers 5 are carried onto a stage section 4, exposure is conducted, and the operation is continued until the completion of all wafers. Accordingly, the generation of bubbles in a resist due to the foaming of N2 at the time of exposure is prevented while the scattering of the resist due to foaming can be inhibited.
申请公布号 JPH03166710(A) 申请公布日期 1991.07.18
申请号 JP19890304793 申请日期 1989.11.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 KADOTA MITSUGI
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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