发明名称 Process for testing individual one piece receptacles
摘要 Process and apparatus for the quality control of individual, one-piece receptacles, which are open at one end. The individual, one-piece receptacles are preferably aligned, in several groups, side by side, similarly with respect to their spatial orientation. The receptacles are turned over to a conveyor line where they pass through at least one testing station at which measurement results specific to each type of receptacle are obtained. The analysis of these results indicates the structural integrity and accuracy of shape of the respective receptacle. The receptacles, as a function of the receptacle-specific measurement results, are removed from the conveyor line if defective; and only the structurally integral and shape-accurate acdeptable receptacles are stacked and further advanced as a stack.
申请公布号 US5032413(A) 申请公布日期 1991.07.16
申请号 US19900492978 申请日期 1990.03.12
申请人 FRANZ HAAS WAFFELMASCHINEN INDUSTRIEGESELLSCHAFT M.B.H. 发明人 HAAS, FRANZ;BUSCHBECK, FRANK;SCHMESKAL, THEODOR
分类号 B24B9/00;A21B5/02;A21C15/00;B07C5/34;B65B35/52;G01M3/32 主分类号 B24B9/00
代理机构 代理人
主权项
地址