发明名称 TESTING INSTRUMENT FOR PROCESS CONTROLLER
摘要 <p>PURPOSE:To omit the change of a vice table and a test table despite the change of a control constant like the gain, etc., by recalculating the reference value stored in a 1st storage part of a ROM, etc., at the time of starting a test in accordance with the set control constant, and using the reference value after storing it in a 2nd storage part of a RAM, etc. CONSTITUTION:A setting means 19 is provided to set a control constant like the gain of a computing element. When the gain, etc., are changed by the means 19 and a test is carried out in response to the changed gain, the reference value is calculated again for a vice table, a test table, etc. These reference values are used after storing them in a RAM, etc. That is, the test table stored fixedly in a 1st storage part 17 of a ROM, etc., is transferred to a 2nd storage part 18 of the RAM, etc., at start of the test. Then the test table is calculated again and automatically in accordance with the changed control constant. Thus it is not required to change the test table of the ROM and a test is automatically carried out in response to the due control constant.</p>
申请公布号 JPH03164910(A) 申请公布日期 1991.07.16
申请号 JP19890306147 申请日期 1989.11.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 MATSUBARA TAKEHIRO
分类号 G05B23/02 主分类号 G05B23/02
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