发明名称 INPUT REGISTER FOR TEST OPERAND GENERATION
摘要 Disclosed is an arrangement for a VLSI circuit, comprising an improved input register useful at least for generating sequentially pseudo-random input operands, wherein the input register is a serial shift register comprised on a chain of serially shifted flip-flops from first to last having a serially shifted external input to its first flip-flop. When configured to generate such operands, the register comprises a plurality of connected segments of unequal length. The output of the last flip-flop in each segment is fed back into predetermined flipflops within that segment, such predetermined flip-flops being of a number less than the number of flip-flops in that segment. The feedback is XORed into each such predetermined flip-flop with the output of the flip-flop that precedes the particular predetermined flip-flop in the chain. The first segment first flipflop receives the XORed output of the last flip-flop in the first segment XORed with the external input, and the other of the plurality of segments first flip-flops receive their input from the last flip-flops of the just preceding segment XORed with the output from the last flip-flop in their segment.
申请公布号 CA1286371(C) 申请公布日期 1991.07.16
申请号 CA19880569945 申请日期 1988.06.21
申请人 CONTROL DATA CORPORATION 发明人 DAANE, DON A.
分类号 G06F11/22;G01R31/28;G01R31/3181;G06F7/58;H01L21/66;H01L21/822;H01L27/04 主分类号 G06F11/22
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