发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE AND II-VI COMPOUND SEMICONDUCTOR CRYSTAL LAYER
摘要 PURPOSE:To reproduce low resistance and high carrier concentration with superior reproducibility, and improve element characteristics and manufacturing yield, by adding specified donor impurity atoms and oxygen atoms to at least one layer of II-VI compound semiconductor layers. CONSTITUTION:An n-ZnSe layer 12 and a p-ZnSe layer 13 as the II-VI compound semiconductor layers are grown on an Si doped n-GaAs substrate 11 as compound semiconductor. An Au electrode 14 is selectively formed on the layer 13. An Au/Ge electrode 15 is formed on the lower surface of the substrate 11. Donar impurity atoms composed of group III or group VII element (e.g. Ga and Cl) and oxygen atoms are added to at least one layer of the layers 12, 13.
申请公布号 JPH03161981(A) 申请公布日期 1991.07.11
申请号 JP19890300702 申请日期 1989.11.21
申请人 TOSHIBA CORP 发明人 MOGI NAOTO;KAMATA ATSUSHI;MIHASHI HIROSHI
分类号 H01L21/365;H01L31/10;H01L33/20;H01L33/28;H01L33/30;H01L33/40;H01S5/00 主分类号 H01L21/365
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