DATA GENERATOR FOR TESTING SEMICONDUCTOR MEMORY,申请号JP19890295686-传众专利搜索

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发明名称	DATA GENERATOR FOR TESTING SEMICONDUCTOR MEMORY
摘要
申请公布号	JPH03156800(A)	申请公布日期	1991.07.04
申请号	JP19890295686	申请日期	1989.11.13
申请人	ADVANTEST CORP	发明人	IMADA HIDEAKI
分类号	G11C29/10;G11C29/00	主分类号	G11C29/10
代理机构		代理人
主权项
地址

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