发明名称 FILM FOR WAFER PROCESSING
摘要 <p>PURPOSE:To increase a close contact property of an adhesive layer with a separator, to suppress a bleeding from the adhesive layer and to prevent a wafer from being contaminated by a method wherein an adhesive which has been filtered by using a filter with a mesh size of 20 to 50mum is used. CONSTITUTION:For a film for wafer processing, a base film is coated with an adhesive and is dried; after that, an adhesive layer is sandwiched between synthetic-resin films called separators. For the adhesive layer, an adhesive which has been filtered by using a filter with a mesh size of 20 to 50mum is used. When the mesh size of the filter is coarser than 50mum, it is not possible to remove particles which are sufficient to keep a smooth property of a coating film; when the mesh size of the filter is finer than 20mum, it takes too much time for a filtering operation and operating efficiency becomes bad. Consequently, when the smooth property of the coating film is increased by filtering the adhesive and by removing giant particles in the adhesive, an empty gap can be eliminated between the separators and the adhesive. Thereby, it is possible to suppress bleeding of an adhesive component and to prevent a wafer form being contaminated.</p>
申请公布号 JPH03156923(A) 申请公布日期 1991.07.04
申请号 JP19890295098 申请日期 1989.11.15
申请人 MITSUI TOATSU CHEM INC 发明人 TAKEMURA YASUO;NARIMATSU OSAMU;KOMATSU KAZUYOSHI
分类号 H01L21/304;C09J7/02;C09J201/00;H01L21/301 主分类号 H01L21/304
代理机构 代理人
主权项
地址