MEMORY TEST PATTERN GENERATOR,申请号EP19860117204-传众专利搜索

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发明名称	MEMORY TEST PATTERN GENERATOR
摘要
申请公布号	EP0225642(B1)	申请公布日期	1991.07.03
申请号	EP19860117204	申请日期	1986.12.10
申请人	ADVANTEST CORPORATION	发明人	IMADA, HIDEAKI
分类号	G11C29/00;G01R31/28;G01R31/319;G11C29/56	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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