| 摘要 |
TEST ADAPTER FOR INTEGRATED CIRCUIT CARRIER A test adapter is provided for connection to a SOIC (small outline integrated circuit) carrier which can be locked to the carrier during test, has a relatively low profile thereby increasing the adapter's stability, and is very simple in construction. The adapter includes a one piece integral frame having two slots in which a pair of contact housings are mounted. The sidewalls of the frame running along the slots are resilient so that they will deform when the contact housings are mounted into the slots. A cam device is mounted on the housings above the frame. When the cam device is actuated, it pivots the housings to bring the contacts thereon into firm engagement with the leads of the carrier. |
