| 摘要 |
PURPOSE:To know an exact diffraction peak position in a short period of time by comparing set thresholds and the level of an X-ray intensity signal, then switching and controlling a scanning speed stepwise according to the result. CONSTITUTION:The X-ray emitted by a tube bulb 2 shines on a sample installed on a goniometer 4 and the diffracted X-ray is detected by a detector 8 which emits the intensity signal S. A scanning speed control section 12 compares the thresholds l1 to l4 determined by a threshold setter 10 and the signal S and switches, respectively stepwise, a pulse motor 6 to a high speed side when the signal S is larger than the respective thresholds l1 to l4 and to the low speed side when the signal is below the respective thresholds. The scanning is executed relatively fast in the base line part where there is a background. The scanning speed decreases as the diffraction peak appears and the height thereof increases. Consequently, the time for measurement to obtain the required diffraction pattern is short overall and the production of a pseudo peak, etc., is averted. The exact peak position is thus known. |
