发明名称 Exposure apparatus
摘要 An exposure apparatus of this invention is used in an exposure process of semiconductor and LCD devices. The exposure apparatus includes a stage on which a semiconductor wafer is placed, a rotating mechanism for rotating the stage, a radiation unit arranged to oppose a support surface of the stage, a slider mechanism for reciprocating the radiation unit along a straight line passing through the center of the support surface of the stage, an exposure range input unit for inputting a desired exposure range of the wafer, an exposure range memory unit for storing the input exposure range, a CCD image sensor for detecting a reference position of the wafer, a relative position detector for detecting a relative position between the detected reference position and the radiation unit, a controller for controlling the sliding mechanism in correspondence with the relative position and the exposure range, and a light amount control mechanism for controlling an amount of light radiated from the irradiation mechanism to the wafer in correspondence with the relative position and the exposure range.
申请公布号 US5028955(A) 申请公布日期 1991.07.02
申请号 US19900480005 申请日期 1990.02.14
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON KYUSHU LIMITED 发明人 HAYASHIDA, YASUSHI;ANAI, NORIYUKI;HIRAKAWA, OSAMU;AKIMOTO, MASAMI;SAKAMOTO, YASUHIRO;SHIGAKI, KEISUKE;MORIYAMA, MASASHI
分类号 G03F7/20 主分类号 G03F7/20
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