发明名称 Apparatus for measuring particle size distribution by making use of laser beam diffraction and scattering.
摘要 <p>Laser beam L is scattered by particles in the sample cell 1. Photosensor assembly 33 detects forward scattered light and assembly 5 detects sideward and backward scattered light for the purpose of increasing the precision of measurement. Both the photosensor assemblies are temperature-monitored by sensors 6 and 7 to prevent erroneous measurement due to small temperature-dependent zero-level shifts of photosensors used in the photosensor assemblies. If temperature variations of or a temperature difference between the assemblies exceeds a predetermined value, an alarm signal is generated with the measurement interrupted automatically. &lt;IMAGE&gt;</p>
申请公布号 EP0434352(A2) 申请公布日期 1991.06.26
申请号 EP19900313810 申请日期 1990.12.18
申请人 SHIMADZU CORPORATION 发明人 NIWA, TAKESHI
分类号 G01N15/02 主分类号 G01N15/02
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