Edge triggered D-type flip-flop scan latch cell with recirculation capability.

摘要

A synchronous latch device macrocell which includes an input gate section and a scannable latch section. Both sections are directly connected together to provide a non-inverting path for input data signals thereby eliminating the need for internal inverting buffer circuits. The non-inverting output of the latch section connects to an output pin and provides a signal representation of the state of the latch device. The output pin is externally connected through a conductor wire to either one of a pair of complementary data input pins of the input gate section. The connection made is selected as a function of which data input pin connection provides the faster loading of the latch device as viewed from the source of the signal applied to the load control pin of the input gate section. <IMAGE>