发明名称 MEASURING APPARATUS FOR WAVEFORM WIDTH
摘要 PURPOSE:To measure a waveform width easily and accurately even if the peak value of a waveform to be measured is changed, by using an attenuated waveform, which is obtained by attenuating an observation waveform, together with the observation waveform. CONSTITUTION:An input observation waveform is attenuated to 1/2 by an attenuator 1 and has the peak value held by a peak hold circuit 2, and this peak value and the observation waveform are compared in level with each other by a comparator 3. Similarly, the output of a peak hold circuit 5 is inputted together with the observation waveform to a comparator 4, and they are compared in level with each other. Outputs of comparators 3 and 4 are inputted to an AND circuit 7 through an AND circuit 6; and only when the output of the AND circuit 6 is 1, clock pulses from a pulse generator 8 are supplied to a counter 9. Its count value is raised twice to obtain the half-amplitude level of a waveform to be measured. Thus, the threshold level is set to a prescribed level for the peak value of the observation waveform to measure the waveform width accurately.
申请公布号 JPS57118166(A) 申请公布日期 1982.07.22
申请号 JP19810003093 申请日期 1981.01.14
申请人 HITACHI SEISAKUSHO KK 发明人 KAWAI NOBUO
分类号 G01R29/02;G01R29/027 主分类号 G01R29/02
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