IMPACT FRACTURE TEST METHOD FOR ELECTRONIC PARTS,申请号JP19890285566-传众专利搜索

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发明名称	IMPACT FRACTURE TEST METHOD FOR ELECTRONIC PARTS
摘要
申请公布号	JPH03146843(A)	申请公布日期	1991.06.21
申请号	JP19890285566	申请日期	1989.10.31
申请人	MURATA MFG CO LTD;UEDA KANJI	发明人	MORIMOTO MASASHI;BANDAI HARUFUMI;UEDA KANJI
分类号	G01N3/30;G01N3/303	主分类号	G01N3/30
代理机构		代理人
主权项
地址

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