发明名称 Reconfigurable architecture for logic test system
摘要 A reconfigurable resource architecture enhances a test system's utilization by allowing product-mix dependent allocation of test system resources. The test system resources can be configured to test several device types with different pin counts simultaneously. The configuration can be changed to accommodate various product mixes based on pin count.
申请公布号 US5025205(A) 申请公布日期 1991.06.18
申请号 US19890372506 申请日期 1989.06.22
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 MYDILL, MARC R.;PILE, SAM R.;O'KEEFE, SHEILA;OKERBLOM, NEAL F.;KEENAN, W. RUSS
分类号 G01R31/28;G01R31/319;G06F11/22 主分类号 G01R31/28
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