Method to control the thickness of an antireflection coating and implementation installation

摘要

Method to control the thickness of an antireflection coating. According to the invention, the semi-conductive structure (14) is fed with a constant current (16) and the voltage (24) is measured at its terminals. This voltage passes through a maximum when the reflectivity of the antireflection coating passes through a minimum. Application for the embodiment of semi-conductive lasers.