发明名称 Method of producing a thin silicon on insulator layer by wafer bonding and chemical thinning
摘要 A method for forming a thin crystal layer of silicon on top of a insulating layer that is supported by a silicon wafer used for electronic device applications. Carbon ions are implanted in a silicon wafer in order to form an etch stop. Said wafer is bonded to a supporting wafer that has an insulating surface layer of silicon oxide or silicon nitride. The silicon substrate of the implanted wafer is removed using an alkaline etching solution or grinding and alkaline etching. The remaining carbon implanted layer forms the thin silicon layer.
申请公布号 US5024723(A) 申请公布日期 1991.06.18
申请号 US19900519941 申请日期 1990.05.07
申请人 GOESELE, ULRICH M.;LEHMANN, VOLKER E. 发明人 GOESELE, ULRICH M.;LEHMANN, VOLKER E.
分类号 H01L21/20;H01L21/265;H01L21/306 主分类号 H01L21/20
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