| 摘要 |
A pair of spaced apart probes generally approximating the contact geometry of conveyed object to be wave soldered is similarly conveyed past and in contact with the solder wave. A timing circuit interconnects with the probes and measures the dwell time of the pair of probes in contact with the solder wave. The probes may have different shaped solder wave contacting parts (e.g., linear edge, points).
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