发明名称 Semiconductor device with adjacent non-oxide layers and the fabrication thereof
摘要 A semiconductor device is disclosed in which a deposited non-oxide layer (44) overlies and physically contacts another non-oxide layer (38) so that no intervening oxide layer is present. The device is fabricated by performing an insitu etch and deposition process. In one embodiment, the device (36) is sealed in a LPCVD chamber (10) and etched using gaseous anhydrous hydrofluoric acid to remove an oxide (40) from one non-oxide layer (38). Then, without exposing the device to a water rinse or to the atmosphere, a chemical vapor deposition process applies the deposited layer (44) upon the other layer (38).
申请公布号 US5023206(A) 申请公布日期 1991.06.11
申请号 US19870133757 申请日期 1987.12.16
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 FREEMAN, DEAN W.
分类号 H01L21/285;H01L21/306 主分类号 H01L21/285
代理机构 代理人
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